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Figure 1 Observed (dots), calculated (superimposed solid) and difference profiles after the Rietveld refinement. The reflection positions are marked by ticks.

Journal logoCRYSTALLOGRAPHIC
COMMUNICATIONS
ISSN: 2056-9890
Volume 63| Part 11| November 2007| Pages m2685-m2686
https://doi.org/10.1107/S1600536807048428
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