Image quality improvement in a hard X-ray projection microscope using total reflection mirror optics

Mimura, H.; Yamauchi, K.; Yamamura, K.; Kubota, A.; Matsuyama, S.; Sano, Y.; Ueno, K.; Endo, K.; Nishino, Y.; Tamasaku, K.; Yabashi, M.; Ishikawa, T.; Mori, Y.

doi:10.1107/S090904950401283X

Figure 9
Intensity distribution images of the diverging X-ray beams reflected by the EEM-finished mirror and by another mirror having the surface figure error profiles shown in Fig. 8

. (a) Mirror having the surface figure error profiles shown in Fig. 8

. (b) EEM-finished mirror.