Resonant soft X-ray diffraction – in extremis

Hatton, P.D.; Wilkins, S.B.; Beale, T.A.W.; Johal, T.K.; Prabhakaran, D.; Boothroyd, A.T.

doi:10.1107/S0909049505009167

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Figure 9
Top: integrated intensity of the ( $[\textstyle{\,{1\over4},{1\over4},0}]$ ) reflection in La_0.5Sr_1.5MnO₄ showing the intensity of the peak at 643 eV (triangles) and 654 eV (inverted triangles). There is a distinct step at T_N, and also the branching ratio (bottom) reaches a maximum at T_N. Errors in the fits are within the symbol size.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 12| Part 4| July 2005| Pages 434-441

https://doi.org/10.1107/S0909049505009167

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