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Figure 1
Schematic of the XRIM experiment showing the X-ray source and the condenser Fresnel zone plate (FZP) X-ray lens that focuses the X-ray beam to a spot on the sample having some complex surface topography. An order-sorting aperture selects the first-order diffraction condition of the FZP lens. The spatial variation of the interfacial intensity is then imaged with an objective lens onto the X-ray CCD camera. Guard slits are used between the objective FZP and the CCD camera to block any X-rays not used in the image. The intensity variation in the XRIM image (on the right) is controlled by phase contrast associated with the interfacial topography (top left).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 15| Part 6| October 2008| Pages 558-571
doi:10.1107/S0909049508023935
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