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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 6
|
Part 2
ISSN: 1600-5767
April 1973 issue
research papers
J. Appl. Cryst.
(1973).
6
,
59-66
,
https://doi.org/10.1107/S0021889873008162
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Errors in quantitative analysis of diffuse scattering from alloys
J. E. Gragg Jnr
,
M. Hayakawa
and
J. B. Cohen
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J. Appl. Cryst.
(1973).
6
,
66-72
,
https://doi.org/10.1107/S0021889873008174
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Intersect distributions and small-angle X-ray scattering theory. III. The intersect distribution for an ellipsoid
H.-I. Wu
and
P. W. Schmidt
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J. Appl. Cryst.
(1973).
6
,
73-75
,
https://doi.org/10.1107/S0021889873008186
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Orientation factors for fiber X-ray diffraction data obtained by the precession method
D. P. Miller
and
V. G. Murphy
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J. Appl. Cryst.
(1973).
6
,
76-80
,
https://doi.org/10.1107/S0021889873008198
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A low-temperature device for protein crystallography
D. J. Marsh
and
G. A. Petsko
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J. Appl. Cryst.
(1973).
6
,
81-86
,
https://doi.org/10.1107/S0021889873008204
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Investigation of non-ideal two-phase polymer structures by small-angle X-ray scattering
C. G. Vonk
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J. Appl. Cryst.
(1973).
6
,
87-96
,
https://doi.org/10.1107/S0021889873008216
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A two-dimensional model of crystal-growth disorder
T. R. Welberry
and
R. Galbraith
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J. Appl. Cryst.
(1973).
6
,
97-98
,
https://doi.org/10.1107/S0021889873008228
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Observation of Pendellösung fringes in a melt-grown lithium niobate single crystal
K. Sugh
and
H. Iwasaki
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J. Appl. Cryst.
(1973).
6
,
98-104
,
https://doi.org/10.1107/S002188987300823X
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Methode d'analyse qualitative de la texture. Application à la description de la texture idéale de laminage du cuivre pur polycristallin
D. Ruer
,
A. Vadon
and
R. Baro
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J. Appl. Cryst.
(1973).
6
,
105-113
,
https://doi.org/10.1107/S0021889873008241
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Etude des systèmes à trois phases par diffusion centrale des rayons X
A. Renouprez
and
B. Imelik
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J. Appl. Cryst.
(1973).
6
,
113-116
,
https://doi.org/10.1107/S0021889873008253
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Intérêt du filtrage des énergies en diffraction electronique
P. Duval
and
L. Henry
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J. Appl. Cryst.
(1973).
6
,
117-122
,
https://doi.org/10.1107/S0021889873008265
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The precision of interplanar distances measured by an energy-dispersive diffractometer
T. Fukamachi
,
S. Hosoya
and
O. Terasaki
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J. Appl. Cryst.
(1973).
6
,
122-128
,
https://doi.org/10.1107/S0021889873008277
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Unit-cell dimension measurements from pairs of X-ray diffraction lines
S. Popović
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J. Appl. Cryst.
(1973).
6
,
129-132
,
https://doi.org/10.1107/S0021889873008289
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An incident-beam ionization chamber and charge integration system for stabilization of X-ray diffraction experiments
R. W. Hendricks
,
J. T. De Lorenzo
,
F. M. Glass
and
R. E. Zedler
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J. Appl. Cryst.
(1973).
6
,
132-135
,
https://doi.org/10.1107/S0021889873008290
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The measurement of single-crystal lattice parameters using a double-diffraction technique
F. J. Spooner
and
C. G. Wilson
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J. Appl. Cryst.
(1973).
6
,
136-138
,
https://doi.org/10.1107/S0021889873008307
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Precision lattice parameters and the coefficients of thermal expansion of hexagonal germanium dioxide
K. V. K. Rao
,
S. V. N. Naidu
and
L. Iyengar
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J. Appl. Cryst.
(1973).
6
,
139-144
,
https://doi.org/10.1107/S0021889873008319
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Double diffraction des rayons X par une substance amorphe
G. Malet
,
C. Cabos
,
A. Escande
and
P. Delord
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J. Appl. Cryst.
(1973).
6
,
145-148
,
https://doi.org/10.1107/S0021889873008320
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Influence of crystal size on electron diffraction intensities
F. R. L. Schoening
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J. Appl. Cryst.
(1973).
6
,
148-152
,
https://doi.org/10.1107/S0021889873008332
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Computerization of Ruland's X-ray method for determination of the crystallinity in polymers
C. G. Vonk
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J. Appl. Cryst.
(1973).
6
,
153-157
,
https://doi.org/10.1107/S0021889873008344
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X-ray powder diffractometry of small (20 mg to 1 μg) samples using standard equipment
P. J. Baldock
and
A. Parker
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short communications
J. Appl. Cryst.
(1973).
6
,
158
,
https://doi.org/10.1107/S0021889873008356
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Consideration of the optimum precession angle for upper-level precession photographs. A correction
J. H. Cross
,
R. J. Fenn
and
A. J. Graham
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J. Appl. Cryst.
(1973).
6
,
158-160
,
https://doi.org/10.1107/S0021889873008368
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Observation, par méthode de Lang, de différents arrangements de dislocations après recuit sur des cristaux de fluorure de lithium
B. Pavis
and
J. Grilhe
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crystal data
J. Appl. Cryst.
(1973).
6
,
161
,
https://doi.org/10.1107/S002188987300837X
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Crystal data on 11-chloro-indazole [2,3-9][3,1]benzoxazin-5-one, C
14
H
7
ClN
2
O
2
P. T. Clarke
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notes and news
J. Appl. Cryst.
(1973).
6
,
162
,
https://doi.org/10.1107/S0021889873008381
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Notes and News
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crystallographers
J. Appl. Cryst.
(1973).
6
,
162
,
https://doi.org/10.1107/S0021889873008393
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Crystallographers
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book reviews
J. Appl. Cryst.
(1973).
6
,
162
,
https://doi.org/10.1107/S002188987300840X
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Researches in powder metallurgy
edited by B. A. Borok
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J. Appl. Cryst.
(1973).
6
,
163
,
https://doi.org/10.1107/S0021889873008411
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Herstellung von Kupfereinkristallen Kleiner Versetzungsdichte
by E. Kappler, W. Uelhoff, H. Ehmer and F. Abbink
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J. Appl. Cryst.
(1973).
6
,
163
,
https://doi.org/10.1107/S0021889873008423
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Crystal growth 1971. Proceedings of 3rd International Conference, France 1971
edited by R. A. Laudise, J. B. Mullin and B. Mutaftschiev
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J. Appl. Cryst.
(1973).
6
,
163-164
,
https://doi.org/10.1107/S0021889873008435
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Technik-Wörterbuch Kristallografie. Englisch-Deutsch-Französisch-Russisch
by K.-O. Backhaus
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J. Appl. Cryst.
(1973).
6
,
164
,
https://doi.org/10.1107/S0021889873008447
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Introduction to glass science
edited by L. D. Pye, H. J. Stevens and W. C. La Course
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