Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 16
|
Part 6
ISSN: 1600-5767
December 1983 issue
research papers
J. Appl. Cryst.
(1983).
16
,
581-589
doi: 10.1107/S0021889883011139
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The sampling theorem and small-angle scattering
T. Gerber
and
P. W. Schmidt
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J. Appl. Cryst.
(1983).
16
,
590-598
doi: 10.1107/S0021889883011140
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Crystallographic characteristics of the process of σ-phase precipitation in chromium–nickel austenitic steels
J. Barcik
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J. Appl. Cryst.
(1983).
16
,
599-605
doi: 10.1107/S0021889883011152
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A double-source double-crystal X-ray spectrometer for high-sensitivity lattice-parameter difference measurements
R. C. Buschert
,
A. J. Meyer
,
D. S. Kauffman
and
J. K. Gotwals
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J. Appl. Cryst.
(1983).
16
,
606-610
doi: 10.1107/S0021889883011164
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Quantitative analysis of intensitities in X-ray topographs by enhanced microfluorescence
S. Weissmann
,
V. A. Greenhut
,
J. Chaudhuri
and
Z. H. Kalman
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J. Appl. Cryst.
(1983).
16
,
611-622
doi: 10.1107/S0021889883011176
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Crystal-structure refinement by profile fitting and least-squares analysis of powder diffractometer data
G. Will
,
W. Parrish
and
T. C. Huang
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J. Appl. Cryst.
(1983).
16
,
623-628
doi: 10.1107/S0021889883011188
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Lattice-parameter measurements of PbHPO
4
single crystals by the ratio method
J. Horváth
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J. Appl. Cryst.
(1983).
16
,
629-636
doi: 10.1107/S002188988301119X
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Oscillation photography of radiation-sensitive crystals using a synchrotron source
M. G. Rossmann
and
J. W. Erickson
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J. Appl. Cryst.
(1983).
16
,
637-640
doi: 10.1107/S0021889883011206
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Qualitative and quantitative morphological study on α and β phases of ammonium pentaborate tetrahydrate
X. Solans
,
M. Font-Altaba
,
M. Aguiló
,
J. Solans
and
M. V. Domenech
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J. Appl. Cryst.
(1983).
16
,
641-644
doi: 10.1107/S0021889883011218
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Correction for escape in X-ray spectra measured using a Ge detector
S. Steenstrup
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short communications
J. Appl. Cryst.
(1983).
16
,
645-646
doi: 10.1107/S002188988301122X
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An X-ray determination of the thermal expansion of the intermetallic compound Ni
3
Zr
S. K. Shadangi
,
S. C. Panda
and
S. Bhan
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J. Appl. Cryst.
(1983).
16
,
646-648
doi: 10.1107/S0021889883011231
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Application of
in situ
synchrotron X-ray topography to the study of a solid-phase transformation: crystallography of the transition in pure titanium
C. Jourdan
and
J. Gastaldi
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J. Appl. Cryst.
(1983).
16
,
648
doi: 10.1107/S0021889883011243
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Asymmetrically grooved monolithic crystal monochromators for suppression of harmonics in synchrotron X-radiation: erratum
H. Hashizume
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crystal data
J. Appl. Cryst.
(1983).
16
,
648
doi: 10.1107/S0021889883011255
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Crystal data for C.I. Pigment Yellow 4, α-(1 -hydroxyethylidene)acetanilide-α-azo-(4'-nitrobenzine)
A. Whitaker
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J. Appl. Cryst.
(1983).
16
,
649
doi: 10.1107/S0021889883011267
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Diagrammes de poudres de l'iminostilbene, C
14
H
11
N, de l'iminodibenzyle, C
14
H
13
N, et de son derivé: le chloro-3 iminodibenzyle, C
14
H
12
ClN
C. Caranoni
and
J. P. Reboul
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J. Appl. Cryst.
(1983).
16
,
649
doi: 10.1107/S0021889883011279
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A new magnesium aluminium zirconium oxide, Mg
5+
x
Al
2.4−
x
Zr
1.7+0.25
x
O
12
with -0.4≲
x
≲0.4
P. Tassot
,
G. Konig
,
F. Liebau
and
F. Seifert
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computer programs
J. Appl. Cryst.
(1983).
16
,
650-651
doi: 10.1107/S0021889883011280
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PLORTEP
: a computer program to translate
PLUTO
instructions into those of
ORTEP
G. Bandel
and
J. L. Sussman
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J. Appl. Cryst.
(1983).
16
,
651-653
doi: 10.1107/S0021889883011292
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FINAX
: a computer program for correcting diffraction angles, refining cell parameters and calculating powder patterns
E. R. Hovestreydt
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J. Appl. Cryst.
(1983).
16
,
653-657
doi: 10.1107/S0021889883011309
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A computer program for the deconvolution of X-ray diffraction profiles with the composite of Pearson type VII functions
H. Toraya
,
M. Yoshimura
and
S. Sōmiya
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laboratory notes
J. Appl. Cryst.
(1983).
16
,
658-659
doi: 10.1107/S0021889883011310
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Measurement of the atomic coordinates of a Kendrew-type model from two projections
P. Dumas
and
B. Rees
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crystallographers
J. Appl. Cryst.
(1983).
16
,
659
doi: 10.1107/S0021889883011322
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Crystallographers
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international union of crystallography
J. Appl. Cryst.
(1983).
16
,
659-660
doi: 10.1107/S0021889883011334
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