Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 18| Part 5

ISSN: 1600-5767

October 1985 issue

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research papers

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X-ray diffraction by cathodically charged austenitic stainless steel

L. S. Zevin and Z. Melamed

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Parallel-beam geometry for single-crystal diffraction

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Growth defects in quartz druses, <a> pseudo-basal dislocations

E. Scandale and F. Stasi

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Odd-order O.D.F. expansion coefficient determination. Case of diffraction strain measurements on cubic materials under macrostress loading

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Synchrotron X-radiation protein crystallography: CEA film absorption factor as a function of wavelength 0.3≤λ≤2Å

I. J. Clifton, D. W. J. Cruickshank, G. Diakun, M. Elder, J. Habash, J. R. Helliwell, R. C. Liddington, P. A. Machin and M. Z. Papiz

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Calculation of diffraction line profiles in the case of a major size effect: application to boehmite AlOOH

D. Grebille and J.-F. Bérar

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Error analysis of a smeared SAXS curve of polystyrene in benzene

O. Kube and J. Springer

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Programmed crystal growth on a diffractometer with focused heat radiation

D. Brodalla, D. Mootz, R. Boese and W. Osswald

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Analysis of diffuse scattering in neutron powder diagrams. Application to glassy carbon

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Neutron interferometry: antiphasing effects caused by geometrical aberrations

U. Kischko and U. Bonse

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Alignment of double-crystal diffractometers

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The crystal structure and the equation of state of thorium nitride for pressures up to 47 GPa

L. Gerward, J. Staun Olsen, U. Benedict, J.-P. Itié and J. C. Spirlet

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Strategy for data collection from protein crystals using a multiwire counter area detector diffractometer

N. H. Xuong, C. Nielsen, R. Hamlin and D. Anderson

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The effects of profile-function truncation in X-ray powder-pattern fitting

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The observation of resonant neutron diffraction

C. J. Carlile, R. C. Ward and B. T. M. Willis

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Moiré patterns in electron diffraction from lanthanum oxide iodide (LaOI)

T. R. Welberry and T. B. Williams

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short communications

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A method for precision lattice-parameter measurement of single crystals. Erratum

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Analysis of anisotrophy of small-angle neutron scattering of polyethylene single crystals. Erratum

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crystal data

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Données crystallographiques sur les composés Ni(C₁₅H₁₁N₃) X₂.nH₂O,X=Cl⁻,NO₂⁻,NCO⁻

R. Cortes, M. I. Arriortua, J. L. Mesa and T. Rojo

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New X-ray powder diffraction data for beryllium gallate, BeGa₂O₄

M. Machida, H. Tabata, S. Kawakami and E. Ishii

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computer programs

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TREOR, a semi-exhaustive trial-and-error powder indexing program for all symmetries

P.-E. Werner, L. Eriksson and M. Westdahl

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computer program abstracts

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NEWMAN, program for calculating and plotting Newman projections from atomic coordinates and cell constants

H. Schenk, N. P. Brandenburg, B. van. Santen, E. Y. Kragten and B. O. Loopstra

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TYPIST – a program for the tabulation of crystallographic results

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laboratory notes

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A lathe-like crystal grinder for grinding pre-aligned crystals into cylindrical cross section

R. A. Wood, G. E. Tode and T. R. Walberry

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Precise orientation of semiconductor surfaces by the back-reflection Laue technique

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crystallographers

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Crystallographers

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new commercial products

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New Commercial Products

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