Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 26| Part 2

ISSN: 1600-5767

April 1993 issue

research papers

A new technique for the observation of X-ray CTR scattering by using an imaging plate detector

T. Shimura and J. Harada

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Maximum-entropy-method analysis of neutron diffraction data

M. Sakata, T. Uno, M. Takata and C. J. Howard

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A method for the accurate determination of crystal truncation rod intensities by X-ray diffraction

E. D. Specht and F. J. Walker

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A four-point crystal bender for dispersive X-ray absorption spectroscopy

P. G. Allen, S. D. Conradson and J. E. Penner-Hahn

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X-ray powder diffraction analysis of silver behenate, a possible low-angle diffraction standard

T. C. Huang, H. Toraya, T. N. Blanton and Y. Wu

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X-ray diffraction studies of annealed Czochralski-grown silicon. I. Double-crystal diffractometry

S. Joksch, P. Zaumseil and W. Zulehner

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X-ray diffracton studies of annealed Czochralski-grown silicon. II. Triple-crystal diffractometry

P. Zaumseil, S. Joksch and W. Zulehner

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Measurement of the radii of gyration of ribosomal components in situ by neutron scattering

D. H. Harrison, R. P. May and P. B. Moore

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Determination of the total texture function from individual orientations modelled by a Lorentzian distribution

T. Baudin and R. Penelle

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The isoscattering point in X-ray scattering curves of globular solute particles measured by the contrast-variation method: the influence of additive penetration into the solute particles

T. Kawaguchi

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X-ray reconstruction topography for observation of the orientation distribution in a single crystal

Y. Chikaura and Y. Suzuki

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The use of carbon-composite cryostat chambers in low-temperature X-ray diffraction

D. D. Coppens, P. Coppens, R. Li and P. Lee

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On the morphology of normal alkane crystals with monoclinic structures: theory and observations

X. Y. Liu and P. Bennema

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Study of defects and structure in organic crystals of potassium hydrogen phthalate

Q. L. Zhao

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Neutron diffraction in flat and bent mosaic crystals for asymmetric geometry

H.-C. Hu and Y. Fang

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A direct indirect method of small-angle scattering data treatment

D. I. Svergun

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Estimation of the true orientation distribution function determination of the maximum-entropy method by the Taylor model

Y. Liu, F. Wang, J. Xu and Z. Liang

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On a small error in SRM640, SRM640a and SRM640b lattice parameters

D. Yoder-Short

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short communications

Indexing unit cells from synchrotron X-ray powder diffraction data

R. J. Cernik and D. Louër

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The lattice constant of a nonperfect crystal measured by X-ray diffraction

M. Leszczynski

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computer programs

PROCHECK: a program to check the stereochemical quality of protein structures

R. A. Laskowski, M. W. MacArthur, D. S. Moss and J. M. Thornton

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The FROG PC series: programs for electron-density and model investigations for proteins

E. A. Vernoslova and V. Yu. Lunin

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PEDX: a program for radial-distribution-function analysis of energy-dispersive X-ray diffraction data from disordered systems

V. Petkov and Y. Waseda

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An effective algorithm for calculation of the Clebsch–Gordan coefficients

L. Zuo, M. Humbert and C. Esling

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laboratory notes

A yokeless flow cell for Laue crystallography

S. L. Edwards

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letters to the editor

The use of alternative filaments for the Rigaku RU 200 X-ray generator

R. Leidich and V. Bernal

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computer program abstracts

CPSR – an integrated software package of menu-driven computer programs for X-ray powder-pattern refinement

Yu. G. Andreev, N. I. Sorokin and A. K. Churakov

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new commercial products

New Commercial Products

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