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A channel plate has been used for taking X-ray diffraction topographs. A topograph of a Si crystal on a fluorescent screen has been recorded by an optical camera. The spatial resolution of the plate has been found to be at least better than 37 μm. The time for the optical recording of a topograph on this plate proved to be about 102 times shorter than that required by standard topography. The sensitivity of the plate has also been measured for Cr Kα radiation.
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