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Figure 3
(a) SEM image of particles deposited on SiO2/Si substrate dopped in a Cu(COOCH3)2 solution with methanol after X-ray irradiation for 5 min. (b) The EDX spectrum measured from the position indicated by the red cross mark in (a).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 27| Part 4| July 2020| Pages 1008-1014
https://doi.org/10.1107/S1600577520005184
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