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Figure 1
(a, b) Three-dimensional renderings of technical drawings of the von Hámos spectrometer. (a) An orthographic view of the entire chamber including the used Maxipix pixel detector. (b) Same as (a) but with a transparent vacuum chamber. (c) A schematic drawing of the von Hámos geometry; for clarity only the central analyzer crystal is shown (S: source/sample; R: crystal-analyzer bending radius; D: detector; dz: detector position; A: analyzer; az: vertical analyzer position; ay: horizontal analyzer position; [\Theta_{{\rm B}}]: Bragg angle; H: analyzer height; w: analyzer width; δaz: vertical deviation from the ideal sample position; δay: horizontal deviation from the ideal sample position). (d)–(f) Sections of typical detector images showing the footprints of non-resonant XES from a germanium single-crystal sample. Possible regions of interest are indicated with thin dashed black lines. Images are shown on a logarithmic intensity scale.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 30| Part 1| January 2023| Pages 251-257
https://doi.org/10.1107/S1600577522011171
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