In situ XAFS–XRD study of the Zr–Y2O3 interaction at extra-high temperatures

Itoh, A.; Matsuo, S.; Yoshida, K.; Konashi, K.; Ikuta, R.; Niino, K.; Arita, Y.; Kobata, M.; Fukuda, T.; Kobayashi, T.; Tanida, H.; Yaita, T.

doi:10.1107/S1600577524003321

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Figure 10
TEM of the cooled specimen (1: Y₂O₃–ZrO₂ solid solution). (a) Low-magnification TEM image, (b and c) selected area diffraction patterns at (i) and (ii), respectively, (d) AC-TEM with Cs (spherical aberration coefficient) = 0 nm and Δf = 5 nm.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 31| Part 4| July 2024|

https://doi.org/10.1107/S1600577524003321

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