Diamond compound refractive lenses for high-energy dark field X-ray microscopy

Staeck, S.; Yildirim, C.; Seiboth, F.; Manning, T.; Roth, T.; Stinville, J.C.; Detlefs, C.

doi:10.1107/S1600577526009859

Figure 4
(a) Checkerboard pattern imaged with the diamond CRL at 33 keV. (b) Fit of the edge points per histogram bin in dependence on the radius from the center of mass of the intensity distribution of (a). The error bars represent the statistical uncertainties. A slight deviation from the linear relation is visible.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 33| Part 6| November 2026|

https://doi.org/10.1107/S1600577526009859

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