X-ray diffraction and imaging special issue (June 2015)
Guest Editor(s): Vincent Favre-Nicolin and Andras Borbely
Guest Co-editor(s): Jose Baruchel, Hubert Renevier and Joel Eymery
This virtual issue of Journal of Applied Crystallography represents some highlights of the 12th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP). The issue collects together a series of articles originally published in the journal between February and June 2015.