Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 15| Part 4

ISSN: 1600-5767

August 1982 issue

lead articles

The Rietveld method in neutron and X-ray powder diffraction

A. Albinati and B. T. M. Willis

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research papers

Precise lattice-constant determinations using measured beam and crystal tilts

M. Nemiroff

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The cation-atom distribution in a (Cr, Fe, Al, Mg)₃O₄ spinel as revealed from the channelling effect in electron-induced X-ray emission

J. Taftø

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A microprocessor-controlled continuous-flow cryostat for single-crystal X-ray diffraction in the range 10–300 K

S. Allen, J. Cosier, A. M. Glazer, T. J. Hastings, D. T. Smith and I. G. Wood

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Noise level and resolution effects in EXAFS spectra

T. I. Morrison, G. K. Shenoy and D. Niarchos

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Ultra-high vacuum heating camera for in situ synchrotron radiation X-ray topographic studies

J. Gastaldi, C. Jourdan, P. Marzo, C. Allasia and J. N. Jullien

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On the topography of chemically etched (00 $\overline{1}$ ) surfaces of ZnO

J. O. Cope

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Kinetic measurement of autoxidation in carotenoids by X-ray diffraction: a new, rapid, and reliable method

E. Abad

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Specimen preparation of low-melting-point solidified gases for low-temperature powder diffractometry

E. Arzi

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The evaluation of crystal perfection by means of the asymmetric Bragg reflections

M. Wołcyrz and K. Łukaszewicz

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A high-temperature deformation stage for X-ray synchrotron topography. Applications to dislocation mechanisms in silicon

A. George and G. Michot

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Sur l'origine des canaux dans les cristaux

E. Scandale and A. Zarka

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Determination of the strain concentration factors around holes and inclusions in crystals by X-ray topography

J. Chaudhuri, Z. H. Kalman, G. J. Weng and S. Weissmann

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Profile shape functions in Rietveld refinements

R. A. Young and D. B. Wiles

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Interactive computer display and analysis of small-molecule crystal structures

S. M. Swanson, R. E. Rosenfield Jnr and E. F. Meyer Jnr

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Small-angle scattering at a pulsed neutron source: comparison with a steady-state reactor

C. S. Borso, J. M. Carpenter, F. S. Williamson, G. L. Holmblad, M. H. Mueller, J. Faber Jnr, J. E. Epperson and S. S. Danyluk

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Addenda to the optimization of quantitative X-ray diffraction analysis

P. Szabó

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Structural ordering in amorphous TbFe₂ and YFe₂

P. D'Antonio, J. H. Konnert, J. J. Rhyne and C. R. Hubbard

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short communications

Thermal expansion of α-HgI₂

S. Gauthier and I. F. Nicolau

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crystal data

Etude de la solution solide (CH₃)₄N.Mn_1−xCu_xCl₃ (x=0–0,5)

A. Cheikh-Rouhou and A. Daoud

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computer programs

Computer program for the derivation of symmetry operations from the space-group symbols

H. Burzlaff and A. Hountas

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Interactive dynamic molecular display

C. L. Nix and B. Rubin

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laboratory notes

A goniometer for large single crystals

H. Shaham

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crystallographers

Crystallographers

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international union of crystallography

Bibliography of Mathematical Crystallography

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book reviews

Nondestructive evaluation of materials edited by J. J. Burke and V. Weiss

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