Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 22| Part 2

ISSN: 1600-5767

April 1989 issue

research papers

Background-filtered transmission diffraction with internal intensity calibration

P. Hiismäki

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A synchrotron radiation monochromator suppressing harmonics

W. Treimer and G. Hildebrandt

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An optical transform and Monte Carlo study of the disorder in β-cristobalite SiO₂

T. R. Welberry, G. L. Hua and R. L. Withers

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Polytypism in a decagonal quasicrystalline Al–Co phase

J. Menon, C. Suryanarayana and G. Singh

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Localizing adsorption sites in zeolitic materials by X-ray powder diffraction: pyridine sorbed in B.ZSM-5

B. F. Mentzen

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Temperature dependence of spontaneous strain in ferroelastic thallous nitrate

M. S. Somayazulu and V. K. Wadhawan

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Integration of Bragg reflections with an Anger camera area detector

C. Wilkinson and A. J. Schultz

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A double cell for controlling nucleation and growth of protein crystals

M. Przybylska

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A high-pressure study of Ti₃O₅ by X-ray diffraction and synchrotron radiation. 1. Pressures up to 38.6 GPa

S. Åsbrink, L. Gerward and J. S. Olsen

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Calibration tests and use of a Nicolet/Xentronics imaging proportional chamber mounted on a conventional source for protein crystallography

Z. Derewenda and J. R. Helliwell

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Constructing rings of specified pucker

R. P. Millane and E. U. Nzewi

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Absolute configuration, polarity, morphology and optical activity of α-LiIO₃

H.-g. Yang, D.-f. Zhang, W.-c. Chen and Y.-y. Li

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Layer thickness determinations with X-ray diffraction

D. E. Anderson and W. J. Thomson

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Changes of pH during biomacromolecule crystallization by vapor diffusion using ammonium sulfate as the precipitant

V. Mikol, J.-L. Rodeau and R. Giegé

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Diffractometer alignment and polarization determination of X-ray beams by means of the Borrmann effect

J.-L. Staudenmann and L. D. Chapman

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Structure refinement of an FeCl₃ crystal using a thin plate sample

S. Hashimoto, K. Forster and S. C. Moss

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short communications

The heavy-atom method without Patterson. A symmetry sum function

F. Pavelčík

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Easy and economic ways of handling air-sensitive crystals for X-ray diffraction studies

Ch. P. Rao

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Rationale of a quick adjustment method for crystal orientation in oscillation photography. Erratum

I.-H. Suh, J.-M. Suh, T.-S. Ko, K. Aoki and H. Yamazaki

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A profile-fitting procedure for analysis of broadened X-ray diffraction peaks. I. Methodology. Erratum

S. Enzo, G. Fagherazzi, A. Benedetti and S. Polizzi

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computer programs

SWATAB, a program to obtain required tables for publication from SHELX76 final output

K. Swaminathan

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PLOTMD – an interactive program to modify molecular plots on a graphics terminal

J. Luo, H. L. Ammon and G. L. Gilliland

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INDEXING – program for indexing powder patterns of cubic, tetragonal, hexagonal and orthorhombic substances on personal computers

W. Paszkowicz

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crystallographers

Crystallographers

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international union of crystallography

Nominations for the Ewald Prize

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new commercial products

New Commercial Products

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Format		BIBTeX
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Format		BIBTeX
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Format		BIBTeX
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Format		BIBTeX
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		CIF
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		Plain Text