Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 25
|
Part 6
ISSN: 1600-5767
December 1992 issue
research papers
J. Appl. Cryst.
(1992).
25
,
665-673
doi: 10.1107/S0021889892004849
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Evolution of crystallographic texture in thin wires
T. Montesin
and
J. J. Heizmann
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J. Appl. Cryst.
(1992).
25
,
674-693
doi: 10.1107/S0021889892005053
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X-ray diffraction of bent crystals in Bragg geometry. I. Perfect-crystal modelling
C. T. Chantler
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J. Appl. Cryst.
(1992).
25
,
694-713
doi: 10.1107/S0021889892005065
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X-ray diffraction of bent crystals in Bragg geometry. II. Non-ideally imperfect crystals, modelling and results
C. T. Chantler
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J. Appl. Cryst.
(1992).
25
,
714-723
doi: 10.1107/S002188989200534X
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The simulation and interpretation of diffraction profiles from partially relaxed layer structures
P. F. Fewster
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J. Appl. Cryst.
(1992).
25
,
724-730
doi: 10.1107/S0021889892005375
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Numbering the crystallographic variants in phase transformation
M. Humbert
,
F. Wagner
and
C. Esling
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J. Appl. Cryst.
(1992).
25
,
731-736
doi: 10.1107/S0021889892005648
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A layer-coupling model for neutron reflectivity and transmissivity calculation in deformed mosaic crystals
H.-C. Hu
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J. Appl. Cryst.
(1992).
25
,
737-743
doi: 10.1107/S0021889892005715
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Electron microscopy of the mineral chalcopyrite, CuFeS
2
K. Z. Baba-Kishi
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J. Appl. Cryst.
(1992).
25
,
744-750
doi: 10.1107/S0021889892005727
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Assessment of material perfection and observation of vibration modes in lithium tantalate by X-ray topography
A. Zarka
,
B. Capelle
,
Y. Zheng
,
J. Détaint
,
J. Schwartzel
,
C. Joly
and
D. Cochet-Muchy
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J. Appl. Cryst.
(1992).
25
,
751-755
doi: 10.1107/S0021889892004874
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Elastic properties of polycrystals in the Voigt-Reuss-Hill approximation
L. Zuo
,
M. Humbert
and
C. Esling
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J. Appl. Cryst.
(1992).
25
,
756-760
doi: 10.1107/S0021889892005387
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Practical aspects of calculating the elastic properties of polycrystals from the texture according to different models
J. Diz
and
M. Humbert
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J. Appl. Cryst.
(1992).
25
,
761-765
doi: 10.1107/S0021889892005776
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Angle calculations for a vertical-axis X-ray diffractometer
H.-H. Hung
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J. Appl. Cryst.
(1992).
25
,
766-769
doi: 10.1107/S0021889892006265
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Texture analysis by the Schulz reflection method: defocalization corrections for thin films
D. Chateigner
,
P. Germi
and
M. Pernet
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J. Appl. Cryst.
(1992).
25
,
770-777
doi: 10.1107/S0021889892006320
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Preferred orientation in erbium thin films observed using synchrotron radiation
M. A. Player
,
G. V. Marr
,
E. Gu
,
H. Savaloni
,
N. Öncan
and
I. H. Munro
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J. Appl. Cryst.
(1992).
25
,
778-784
doi: 10.1107/S0021889892006368
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The isoscattering point in X-ray scattering curves of globular solute particles measured by the contrast-variation method
T. Kawaguchi
and
T. Hamanaka
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J. Appl. Cryst.
(1992).
25
,
785-788
doi: 10.1107/S0021889892007064
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A multilayer analyser suitable for linear detection of anomalous small-angle X-ray scattering
J. P. Simon
,
J. Mainville
,
E. Ziegler
and
O. Lyon
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J. Appl. Cryst.
(1992).
25
,
789-796
doi: 10.1107/S0021889892004072
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Improvement of neutron reflectivity of an Ni-Ti multilayer by hydrogenation of titanium layers
M. Mâcaza
,
Z. Jiang
,
F. Samuel
,
B. Farnoux
and
B. Vidal
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J. Appl. Cryst.
(1992).
25
,
797-799
doi: 10.1107/S0021889892007416
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Determination of the Debye-Waller factor of molybdenum by powder neutron diffraction
J. Bashir
,
N. M. Butt
,
M. Nasir Khan
,
Q. H. Khan
,
B. Zhang
,
J. Yang
,
Y. Ding
and
C. Ye
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short communications
J. Appl. Cryst.
(1992).
25
,
800-801
doi: 10.1107/S0021889892004837
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On the interpretation of X-ray diffraction effects in ferroelectric crystals subjected to laser irradiation
S. G. Zhukov
,
G. V. Fetisov
and
L. A. Aslanov
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J. Appl. Cryst.
(1992).
25
,
801-802
doi: 10.1107/S0021889892010367
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Calculation of diffuse scattering from simulated disordered crystals: a comparison with optical transforms. Erratum
B. D. Butler
and
T. R. Welberry
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computer programs
J. Appl. Cryst.
(1992).
25
,
803-806
doi: 10.1107/S0021889892006733
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The database BIOSCAT: a tool for structure research by scattering and hydrodynamic methods
J. J. Müller
,
H. Pankow
,
B. Poppe
and
G. Damaschun
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laboratory notes
J. Appl. Cryst.
(1992).
25
,
807-808
doi: 10.1107/S0021889892006551
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Orientation attachment for crystallographic apparatus
S. G. Clackson
and
J. S. Reid
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fast communications
J. Appl. Cryst.
(1992).
25
,
809-811
doi: 10.1107/S0021889892008410
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The Weissenberg method for the collection of X-ray diffraction data from macromolecular crystals: modifications to the data-processing program
WEIS
B. A. Fields
,
J. M. Guss
,
M. C. Lawrence
and
A. Nakagawa
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international union of crystallography
J. Appl. Cryst.
(1992).
25
,
812
doi: 10.1107/S0021889892099849
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