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Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767

August 2026 issue

Early view articles

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research papers


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This work demonstrates that diffraction-based residual strain calculations and uncertainty estimates depend on how grain populations are sub-sampled, with important implications for interpreting residual stresses in heterogeneous materials with fine-scale microstructure and strain gradients.

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Powder diffraction is used to reveal X-ray-induced hydride formation in palladium nanowires in a gaseous hydrogen environment.

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This work provides a unified crystallographic description of a series of rare-earth nitrate hydrates, [RE(NO3)3(H2O)nxH2O (RE = La–Lu, Y), and their aqueous solutions. The findings integrate X-ray diffraction, EXAFS, topological descriptors and computational modelling to offer transferable method­ologies for interpreting structural anomalies in coordination compounds and precursors for functional materials.

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Pair distance distribution functions of interacting ellipsoidal particles can be hard to interpret. This difficulty can be circumvented partially by the generalized indirect Fourier transformation.

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A full-profile quantitative X-ray phase analysis method is developed for mixtures of low-temperature aluminium oxides and pseudoboehmite, combining experimental and calculated (via the Debye scattering equation) reference profiles. The approach provides high accuracy for model γ-Al2O3/χ-Al2O3 and γ-Al2O3/AlOOH mixtures and is applicable to complex nanocrystalline oxide and catalyst systems with poorly described diffraction patterns.

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This study investigates the impact of correlated Ruddlesden–Popper faults on the diffraction patterns of tetragonal A2BO4-type structures, using Sr2TiO4 as a representative example. Simulations demonstrate that these correlations give rise to distinctive diffraction features – including intensity redistribution, anisotropic peak broadening and diffuse scattering – that distinguish coherent intergrowths of Sr2TiO4 and Sr3Ti2O7 from conventional two-phase systems.
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