issue contents
November 2020 issue
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Cover illustration: In this issue, Fang et al. [Acta Cryst. (2020), A76, 652-663] present a flexible and standalone forward simulation model to compute diffraction projections for laboratory X-ray diffraction contrast tomography, which is a novel technique for non-destructive 3D characterization of grain structures in bulk materials. With this modelling tool detailed analysis of diffraction spots as a function of grain sizes and lattice-plane families for samples with any crystal structure becomes simple and robust. The image shows the simulated diffraction spots (top left), the experimental ones (bottom left) and the comparisons between them (right) for the same grain diffracting at a series of sample rotation angles.
foundations
research papers
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Electron image contrast analysis of mosaicity in rutile nanocrystals using direct electron detection
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international union of crystallography
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book reviews
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