issue contents
July 2024 issue
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Cover illustration: In this issue, Dallmann et al. [Acta Cryst. (2024), A80, 315–328] present a ray-tracing algorithm for the simulation of absorption effects in X-ray diffraction experiments in reflection geometry. The algorithm allows the calculation of absorption corrections for sample models with arbitrary microstructure in the form of surface roughness, waviness, porosity and particle distributions, as demonstrated by analyzing the absorption corrections resulting from surface models with roughness on various lateral and vertical length scales, as depicted in the cover image.
research papers
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crystal lattices
short communications
book reviews
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