issue contents
May 2025 issue

Cover illustration: Electronic devices rely on thin layers of materials on top of substrates, typically single crystals; however, characterizing the atomic structures of these films is difficult, especially in X-ray total scattering, due to the large signal from the substrate (bright spots). In this issue Alverson et al. [Acta Cryst. (2025), A81, 175–187] describe their machine learning program, IsoDAT2D, which isolates the distinct structural features of amorphous and nanocrystalline thin films (rings), providing access to structural information and materials understanding that can be used to design next-generation information storage and computing devices.
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international union of crystallography
