Error evaluation of partial scattering functions obtained from contrast-variation small-angle neutron scattering

We have established mathematical error estimation methods for structural analysis of multi-component systems by contrast-variation small-angle neutron scattering. Our methods can be used to optimize the selection of scattering contrasts to minimize error propagation.

Thermal diffuse scattering analysis of Ag₂O binary system via X-ray powder diffraction

This study analyses thermal diffuse scattering in X-ray powder patterns using a combined Rietveld and correlated displacement model approach applied to Ag₂O in reciprocal space.

Effect of thickness and noise on angular correlation analysis from scanning electron nanobeam diffraction of disordered carbon

The impact of sample thickness and experimental noise on angular correlation analysis from scanning electron nanobeam diffraction patterns of disordered carbon is investigated and analyzed regarding the interpretability of the analysis results.

High-accuracy high-resolution measurements of fluorescence in manganese using extended-range high-energy-resolution fluorescence detection

By applying the new technique of extended-range high-energy-resolution fluorescence detection (XR-HERFD), developed from high-resolution resonant inelastic X-ray scattering and HERFD, the analysis of data from all three techniques is explained, with solid manganese as an example. This approach allows the discovery of new physical processes in matter.

Residual stress depth profiling based on a triaxial stress model: the principal stress gradients in magnetron-sputtered molybdenum films

A depth-dependent investigation of the principal stress gradients in a sputtered coating is described, applying asymmetric diffraction and different data evaluation routines.

A new technical solution to the problem of increasing the resolution of X-ray diffraction methods

A new method of diffraction microradiography of single crystals is proposed with the aim of increasing the resolution of X-ray topographic patterns. For the implementation of this method, a device for synchronous scanning of the slit for transmitting separate parts of the X-ray diffraction pattern and the X-ray film with a predetermined speed ratio is designed, created and tested.