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November 2024 issue

Cover illustration: Implementation of continuous scanning for X-ray emission spectroscopy using a five-analyzer Johann spectrometer at the Inner Shell Spectroscopy beamline at NSLS-II (see Tayal, Coburn, Abel, Rakitin, Ivashkevych, Wlodek, Wierzbicki, Xu, Nazaretski, Stavitski and Leshchev, pages 1609–1621). Traditionally, X-ray emission scanning with Johann spectrometers is performed step-wise, resulting in inefficiencies due to mechanical motion overhead, typically around one second per step. By leveraging the beamline's asynchronous data acquisition system and integrating an area detector into the spectrometer, the new approach allows the collection of X-ray emission spectra with virtually zero dead time, significantly enhancing the speed and efficiency of spectroscopic experiments.
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