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PhotonMEADOW2023 Joint Workshop
Edited by E. Plönjes, J. Grünert, P. Juranić, K. Tiedtke and M. Zangrando
This virtual issue contains articles from the PhotonMEADOW2023 joint workshop, hosted by Elettra Sincrotrone Trieste at the International Centre for Theoretical Physics on 12–14 September 2023.
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The beam shaping optics of synchrotrons and X-ray free-electron lasers are routinely measured using deflectometric profilometers, which use autocollimators to evaluate the surface slope from the displacement of a reticle image on a detector. Here, novel strategies to reduce systematic measurement errors by using a set of overlapping images of the reticle obtained at different positions on the detector, which can reduce the systematic errors by up to a factor of four to five without recourse to external measurements, are discussed.