special issues

Forthcoming special issues

Advanced Neutron Scattering Instrumentation

Guest Editors: Dimitri Argyriou (Ames Laboratory, USA; e-mail: [email protected]) and Andrew J. Allen (NIST, USA; e-mail: [email protected])

Closing date for submissions: DEADLINE EXTENDED to 1 October 2017




Recently published special issues

High-resolution X-ray diffraction and imaging (XTOP 2016)

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Guest Editors: Virginie Chamard (Institute Fresnel, Marseille, France; e-mail: [email protected]) and Václav Holý (Charles University in Prague, Czech Republic; e-mail: [email protected])

The articles in this virtual special issue of Journal of Applied Crystallography represent some highlights of the 13th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP 2016). The topics of the published articles cover the broad spectrum of problems discussed during the conference, highlighting in particular four specific X-ray techniques: X-ray Bragg diffraction, small-angle scattering and reflectivity, X-ray diffraction imaging, and coherent (phase-sensitive) X-ray imaging. These open-access articles were originally published in the journal between April and June 2017.

Small-angle scattering special issue

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Guest Editors: Michael Gradzielski (TU Berlin, Germany; e-mail: [email protected]) and Andrew J. Allen (NIST, USA; e-mail: [email protected])

The articles in this virtual special issue of Journal of Applied Crystallography represent some highlights of the 16th International Conference on Small-Angle Scattering (SAS2015). The issue brings together articles originally published in the journal between October and December 2016.

CCP-FEL: a collection of computer programs for FEL research

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Guest Editors: Filipe Maia (Uppsala University, Sweden; e-mail: [email protected]), Thomas A. White (CFEL, Hamburg, Germany; e-mail: [email protected]), N. Duane Loh (National University of Singapore; e-mail: [email protected]) and Janos Hajdu (Uppsala University, Sweden; e-mail: [email protected])

This virtual special issue of Journal of Applied Crystallography presents tools for a range of topics in free-electron laser research such as simulation of experiments, online monitoring of data collection, selection of hits, diagnostics of data quality, data management, data analysis and structure determination for both nanocrystallography and single-particle diffractive imaging These specially commissioned articles were originally published in the journal between April and August 2016.

X-ray diffraction and imaging (XTOP2014)

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Guest Editors: Vincent Favre-Nicolin (Université Grenoble Alpes, France; e-mail: [email protected]) and András Borbély (Ecole National Supérieure des Mines, Saint-Etienne, France; e-mail: [email protected])

This virtual issue of Journal of Applied Crystallography represents some highlights of the 12th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP). The issue collects together a series of articles originally published in the journal between February and June 2015.

Full list of published special issues

13th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP2016)
J. Appl. Cryst. High-resolution X-ray diffraction and imaging special issue (1 June 2017)

Small-angle scattering special issue
J. Appl. Cryst. Small-angle scattering special issue (1 December 2016)

CCP-FEL: a collection of computer programs for FEL research
J. Appl. Cryst. CCP-FEL: a collection of computer programs for FEL research (1 August 2016)

12th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP2014)
J. Appl. Cryst. X-ray diffraction and imaging special issue (27 June 2015)

Small-Angle Scattering
J. Appl. Cryst. Small-angle scattering special issue (19 February 2014)

11th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP2012), St Petersburg, Russia, September 2012
J. Appl. Cryst. Volume 46, Part 4 (pp. 841-1248, 1 August 2013)

X-ray Diffraction Microscopy
J. Appl. Cryst. X-ray diffraction microscopy special issue (15 March 2013)

Crystallography education and training for the 21st century
J. Appl. Cryst. Volume 43, Part 5 Number 2 (pp. 1137-1284, 1 October 2010)

13th International Conference on Small-Angle Scattering, Kyoto, Japan, 9-13 July 2006
J. Appl. Cryst. Volume 40, Part s1 (pp. s1-s705, 21 April 2007)

12th International Conference on Small-Angle Scattering, Venice, Italy, 25-29 August 2002
J. Appl. Cryst. Volume 36, Part 3 Number 1 (pp. 373-868, 1 June 2003)

11th International Conference on Small-Angle Scattering, Brookhaven National Laboratory, USA, 17-20 May 1999
J. Appl. Cryst. Volume 33, Part 3 Number 1 (pp. 421-868, 1 June 2000)

10th International Conference on Small-Angle Scattering, 1996, Campinas, Brazil, 21-26 July 1996
J. Appl. Cryst. Volume 30, Part 5, Number 2 (pp. 569-888, 1 October 1997)

8th International Conference on Small-Angle Scattering, 1990
J. Appl. Cryst. Volume 24, Part 5 (pp. 413-974, 1 October 1991)

International Conference on Applications and Techniques of Small-Angle Scattering, 1987
J. Appl. Cryst. Volume 21, Part 6 (pp. 581-1009, 1 December 1988)

4th International Conference on Small-Angle Scattering, 1977
J. Appl. Cryst. Volume 11, Part 5 (pp. 295-674, 1 October 1978)

3rd International Conference on Small-Angle Scattering, 1973
J. Appl. Cryst. Volume 7, Part 2 (pp. 95-314, 1 April 1974)



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