issue contents

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775

May 1999 issue

XAFS X

Chicago, USA, 10-14 August 1998

Highlighted illustration

Cover illustration: The front cover of the issue is based on the historical account of XAFS given in the article by Lytle, pages 123-134. It traces the development of XAFS from the first observation of an absorption edge by Maurice de Broglie.



facility information


editorial


J. Synchrotron Rad. (1999). 6, 121-122
doi: 10.1107/S0909049599005804

plenary papers


J. Synchrotron Rad. (1999). 6, 123-134
doi: 10.1107/S0909049599001260
link to html
A personal histroy of the development of EXAFS summarizing the early experiments and theory. The author's work from 1960–1974 is emphasized.

J. Synchrotron Rad. (1999). 6, 135-141
doi: 10.1107/S0909049599002010
link to html
Analysis of AXAFS (atomic X-ray absorption fine structure) spectra and Pt–H shape resonances of supported platinum catalysts show an influence of the support on the electronic properties of the platinum particles. An increase of the alkalinity of the support leads to a decrease of the ionization potential of the platinum metal particles and a weaker Pt–H bond strength.

sources, beamlines and optics




J. Synchrotron Rad. (1999). 6, 149-151
doi: 10.1107/S0909049598016781

J. Synchrotron Rad. (1999). 6, 152-154
doi: 10.1107/S0909049598014599

J. Synchrotron Rad. (1999). 6, 155-157
doi: 10.1107/S0909049598017245

J. Synchrotron Rad. (1999). 6, 158-160
doi: 10.1107/S0909049599001879


J. Synchrotron Rad. (1999). 6, 164-166
doi: 10.1107/S0909049598016835


J. Synchrotron Rad. (1999). 6, 170-171
doi: 10.1107/S0909049599000084

J. Synchrotron Rad. (1999). 6, 172-173
doi: 10.1107/S090904959801752X

J. Synchrotron Rad. (1999). 6, 174-175
doi: 10.1107/S0909049598017531

J. Synchrotron Rad. (1999). 6, 176-178
doi: 10.1107/S0909049598013971

J. Synchrotron Rad. (1999). 6, 179-181
doi: 10.1107/S0909049599001867

J. Synchrotron Rad. (1999). 6, 182-184
doi: 10.1107/S0909049598016823

J. Synchrotron Rad. (1999). 6, 185-187
doi: 10.1107/S090904959801810X

J. Synchrotron Rad. (1999). 6, 188-189
doi: 10.1107/S0909049599001326

sample chambers, detectors and detection methods


J. Synchrotron Rad. (1999). 6, 193-194
doi: 10.1107/S0909049598017749


J. Synchrotron Rad. (1999). 6, 198-200
doi: 10.1107/S0909049599001168


J. Synchrotron Rad. (1999). 6, 204-206
doi: 10.1107/S0909049598017002


J. Synchrotron Rad. (1999). 6, 209-211
doi: 10.1107/S0909049598017518

J. Synchrotron Rad. (1999). 6, 212-214
doi: 10.1107/S0909049599002022

J. Synchrotron Rad. (1999). 6, 215-216
doi: 10.1107/S0909049599001314


J. Synchrotron Rad. (1999). 6, 220-221
doi: 10.1107/S0909049598018111

theory and data analysis


J. Synchrotron Rad. (1999). 6, 225-227
doi: 10.1107/S0909049599000722

J. Synchrotron Rad. (1999). 6, 228-230
doi: 10.1107/S0909049598017087

J. Synchrotron Rad. (1999). 6, 231-232
doi: 10.1107/S090904959900093X

J. Synchrotron Rad. (1999). 6, 233-235
doi: 10.1107/S0909049599000734

J. Synchrotron Rad. (1999). 6, 236-238
doi: 10.1107/S0909049598017099


J. Synchrotron Rad. (1999). 6, 242-243
doi: 10.1107/S090904959801382X

J. Synchrotron Rad. (1999). 6, 244-246
doi: 10.1107/S0909049599000758



J. Synchrotron Rad. (1999). 6, 251-252
doi: 10.1107/S0909049599001090

J. Synchrotron Rad. (1999). 6, 253-254
doi: 10.1107/S0909049598017105

J. Synchrotron Rad. (1999). 6, 255-257
doi: 10.1107/S0909049599000771


J. Synchrotron Rad. (1999). 6, 261-263
doi: 10.1107/S090904959801680X

J. Synchrotron Rad. (1999). 6, 264-265
doi: 10.1107/S0909049598018147


J. Synchrotron Rad. (1999). 6, 268-270
doi: 10.1107/S0909049599001399

J. Synchrotron Rad. (1999). 6, 271-273
doi: 10.1107/S0909049598018159

J. Synchrotron Rad. (1999). 6, 274-275
doi: 10.1107/S0909049598018160

J. Synchrotron Rad. (1999). 6, 276-277
doi: 10.1107/S0909049599000795

J. Synchrotron Rad. (1999). 6, 278-280
doi: 10.1107/S0909049599002162


J. Synchrotron Rad. (1999). 6, 284-286
doi: 10.1107/S0909049599000965

J. Synchrotron Rad. (1999). 6, 287-289
doi: 10.1107/S0909049598015611


J. Synchrotron Rad. (1999). 6, 293-295
doi: 10.1107/S0909049598017786

J. Synchrotron Rad. (1999). 6, 296-298
doi: 10.1107/S0909049599002186


J. Synchrotron Rad. (1999). 6, 302-303
doi: 10.1107/S0909049598018172

J. Synchrotron Rad. (1999). 6, 304-305
doi: 10.1107/S0909049598017166

J. Synchrotron Rad. (1999). 6, 306-307
doi: 10.1107/S0909049598018184


J. Synchrotron Rad. (1999). 6, 310-312
doi: 10.1107/S0909049598018202

J. Synchrotron Rad. (1999). 6, 313-314
doi: 10.1107/S0909049599001685

J. Synchrotron Rad. (1999). 6, 315-316
doi: 10.1107/S0909049599001697

J. Synchrotron Rad. (1999). 6, 317-319
doi: 10.1107/S0909049599002198

J. Synchrotron Rad. (1999). 6, 320-322
doi: 10.1107/S0909049598017129

J. Synchrotron Rad. (1999). 6, 323-325
doi: 10.1107/S0909049599001521

J. Synchrotron Rad. (1999). 6, 326-328
doi: 10.1107/S0909049598016884

diffraction anomalous fine structure



J. Synchrotron Rad. (1999). 6, 332-334
doi: 10.1107/S0909049598013636


J. Synchrotron Rad. (1999). 6, 338-340
doi: 10.1107/S0909049598013648

J. Synchrotron Rad. (1999). 6, 341-343
doi: 10.1107/S0909049598016537

microprobe XAFS/polarized XAFS


J. Synchrotron Rad. (1999). 6, 344-346
doi: 10.1107/S0909049598015969

J. Synchrotron Rad. (1999). 6, 347-349
doi: 10.1107/S090904959801677X

J. Synchrotron Rad. (1999). 6, 350-352
doi: 10.1107/S0909049598016811

J. Synchrotron Rad. (1999). 6, 353-355
doi: 10.1107/S0909049598016185

J. Synchrotron Rad. (1999). 6, 356-358
doi: 10.1107/S0909049598017270




J. Synchrotron Rad. (1999). 6, 367-369
doi: 10.1107/S0909049599001351

J. Synchrotron Rad. (1999). 6, 370-372
doi: 10.1107/S0909049599001703

J. Synchrotron Rad. (1999). 6, 373-375
doi: 10.1107/S0909049599001405

J. Synchrotron Rad. (1999). 6, 376-378
doi: 10.1107/S0909049599001338

J. Synchrotron Rad. (1999). 6, 379-380
doi: 10.1107/S0909049599002174

biology


J. Synchrotron Rad. (1999). 6, 384-386
doi: 10.1107/S0909049599000047

J. Synchrotron Rad. (1999). 6, 387-388
doi: 10.1107/S0